The defect classification and the reason formingdefect of VGA thin film transistor active matrix liquid crystal displays are analysed.
分析了VGA有源矩阵液晶显示器的缺陷分类、产生原因。
2
The formingdefect of the bend forging and the influence of blank and die shape parameters are studied. All of these provide theoretical basis for practice.
The defect classification and the reason formingdefect of VGA thin film transistor active matrix liquid crystal displays are analysed. Open tester, short tester and display tester are developed.