A wetness measurement system based on cavityperturbation method is designed for precise measuring, including automatic frequency tracing system and equal precision frequency measurement system.
Taking an external cavity laser diode (ECLD) as an example, calculations indicate that the perturbation analysis may become invalid under loss modulation.
以可调谐双稳外腔半导体激光器(ECLD)为例，指明了在损耗调制下，扰动近似分析可能会失效。
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The calculated and experimental results show that the measuring method of non-electrical parameters with the microwave cavity by perturbation has a high resolution.