The crystal structure, surface morphology and spectral characteristics of the samples were investigated by X-ray diffraction (XRD), SEM and fluorescence spectrophotometer.
用XRD、SEM和荧光分光光度计，对试样的晶体结构、表面形貌及发光性能进行表征。
2
Optical properties and adhesion of Ag films with Cr interlayer of different thickness on glass substrates were investigated by using spectrophotometer and X-ray diffraction (XRD).