We use spreadingResistance technique to test and analyze silicon and silica base materials. This technique is more suitable to control material quality and develop new materials.
本文利用扩展电阻技术对半导体硅、硅基材料进行测试分析,从而用以开发新材料和评估材料的质量。
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The effects of choosing lapping bevel Angle during testing semiconductor devices and LSI chips by spreadingresistance technique on measurement accuracy have been investigated in this paper.
讨论了在检测半导体器件和集成电路芯片时,不同研磨倾斜角度对扩展电阻量值的影响。
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Q: Your report alerts us to resistance to artemisinins particularly on the thai-cambodian border, but also spreading to other parts of the Mekong region.