The result of the experiments showed that this fault injector based on MCUsystem can simulate the effect of singleeventupset, and can succeed in fault injection to the system.
实验结果证明,此故障注入方法可以模拟单粒子事件对系统的影响,并能成功对系统注入故障。
2
The incident Angle dependences of the cross sections for singleeventupset and singleevent latchup are presented.
获得了单粒子翻转和单粒子闭锁截面与入射角度的依赖关系。
3
Two typical master-slave type D flip-flop of strong hardness to SingleEventUpset(SEU) for radiation environment are introduced.