Lifetimemeasurement and resistance degradation as a function of time were used to describe this phenomenon.
使用寿命量测和阻值劣化随时间变化的关系来描述这现象。
2
The sensitivity for the semiconductor minority carrier lifetimemeasurement system was determined using microwave photoconductance decay.
对微波光电导法测量半导体少数载流子寿命的测试系统进行灵敏度分析。
3
On the base of fluorescence quantum yield and lifetimemeasurement, the rate constants of radiation decay and non radiation decay of this compound were calculated.