闳康科技共有 25台FIB，我们以一天24小时的运作，提供客户最实时的服务。 ma-tek.com | In order to support all customers' need, we [...] install ed 25FIBs to guarantee [...]the services can be accomplished within 24 hours. ma-tek.com |
内容包含: 机台原理， 线路修补技术介绍及应用 ，FIB在故障分析技术上的应用及限制。 ma-tek.com | The content contains principle, circuit repair technique and its application. ma-tek.com |
闳康科技提供多元化 的FIB服务，机台共多达25台，可提供24小时全天候的分析服务。 ma-tek.com | Ma-tek provides a wide range of services, up to [...] total of 25 FIBs, isopen 24-hour [...]7-day analysis service. ma-tek.com |
以 FIB制备SEM/TEM试片，可选择单面或双面切割，清楚解析65nm以下的制程结构及缺陷。 ma-tek.com | Specimen p reparationby FIB forSTEM/ TEMobservation, [...]either single or double sides cutting, to clearly reveal the process [...]result and defect of 65nm and below technology device. ma-tek.com |
聚焦式离子束显微 镜(FIB)的利用镓(Ga)金属作为离子源，再加上负电场 (Extractor) 牵引尖端细小的镓原子，而导出镓离子束再以电透镜聚焦，经过一连串变化孔径 (Automatic Variable Aperture, AVA)可决定离子束的大小，再经过二次聚焦至试片表面，利用物理碰撞来进行特定图案的加工，一般单粒子束 的FIB(Single BeamFIB)，可以提供材料切割、沈积金属、蚀刻金属和选择性蚀刻氧化层等功能。 ma-tek.com | Focused Ion Be ammicroscope(FIB) usegallium(Ga) as a metal ion source, coupled with negative electric field (Extractor) traction-the-art small gallium atoms, and the export of gallium ion beam in order to re-focus lens power after a series of changes in the aperture ( Automatic Variable Aperture, AVA) may determine the size of the ion beam, and then after the second focus on the surface of the collision use of physical to specific patterns of processing, single-General of the partic lebeam FIB (Single Beam FIB),can provide [...]cutting material, Metal [...]deposition, metal etching and selective oxidation has features such as etching. ma-tek.com |
若结合场发射式电子显微镜进行实时观测，即所谓的双粒子 束FIB(DualBeamFIB)，除了以高能离子束进行直接蚀刻的功能外，可藉由气体辅助蚀刻系统的帮助，提高蚀刻的选择比与提升蚀刻速率，并可直接进行特定材料的沈积。 ma-tek.com | If the combination of field emission electron microscope to [...] conduct real-time observation, the [...] so-called du al-beamFIB (Dual BeamFIB), in addition [...]to direct high-energy ion-beam etching [...]of the functions can be etched by gas-assisted system to help improve the choice of etching material, enhance the etching rate, and direct deposition of specific materials. ma-tek.com |
AIM、SELA独特的适应性离子研磨技术比传统的聚焦离子束 （FIB）激素和优越；它可以将从大面积材料制作的样品厚度降低到20纳米以下，精确度高、无伪影质量、厚度变化可控且产量较高。 cn.camtek.co.il | AIM, SELA’s unique Adaptive Ion Milling [...] technology, is superior to the traditional [...] Focus edIon Beam (FIB) technology;it can [...]reduce lamella thickness below 20 nanometers [...]over a large area with high precision, artifact-free quality, controlled thickness variation and higher throughput. camtek.co.il |
于2008年7月底装机完成，除了原来可边切边看之外也适合大面积的快速切割，切割速率可比传 统FIB加速3-5倍，欢迎大家提供试片和我们一起体验新机台新技术的应用效果。 ma-tek.com | installed at the end of July 2008, besides the original features can be view simultaneously with sophisticated cutting edge, it also suits the big area fast cutting, and the [...] cutting speed may accelerate 3-5 time [...] compared to traditionalFIB,welcome to provide [...]the sample and experiences the new technology [...]together with this application features. ma-tek.com |
我们另有业界最新的双 枪FIB系统，可以满足客户做产品故障分析的多元需求：位置的精确与高质量的影像，再搭配我们专业的人员与丰富的经验，提供您、准确、精确、效率、有效的产品故障快速分析服务。 ma-tek.com | MA-tek utilizes the best quality instruments and the most professional staffs to provide the most accurate, precise and efficient analytical services. ma-tek.com |
2008年1月闳康科技于新竹科学园区成立矽导实验室，除将过去所属材料分析设备及集中管理提供技术服务外，并持续投资高单价T EM、FIB、SIMS等最先进分析设备。 ma-tek.com | MA-tek invest on the most advanced analytical tools including field emission transmission electron microscopes (FE-TEM) equipped with various analytical functions /EDX/EELS/HAADF), Focused Ion Beam (FIB) for circuit editing and cross-sectioning, magnetic sector SIMS, quadrupole SIMS, X-ray photoelectron spectroscope (XPS) for organic and inorganic composition analysis, and field emission scanning electron microscopes (FE-SEM), etc. It makes [...] MA-tek the world leading analytical laboratory [...] in mate rials analysis field, covering [...]applications in all kinds of novel materials research. ma-tek.com |