A specific thin-film technology is based on the use of Copper Indium Diselenide (CIS) material. 还有一种基于使用铜铟硒化合物(CIS)材料的特殊薄膜技术。
A 77.5% of reduction in deposit formation could be obtained when the multiplex additive of tetralin/ tetralone binary donor and diphenyl diselenide was added into n-dodecane. 复合添加剂比单一试剂效果更明显,二元供氢剂与二苯二硒的复合添加剂可减少77.5%的裂解沉积。