Differential interference contrast microscopy

Micrasterias furcata imaged in transmitted DIC microscopy.

Laser-induced optical damage in LiNbO3 under 150× Nomarski microscopy.

An illustration of the process of image production in a DIC microscope.

Partially developed photoresist via Nomarski DIC

Differential interference contrast (DIC) microscopy, also known as Nomarski interference contrast (NIC) or Nomarski microscopy, is an optical microscopy technique used to enhance the contrast in unstained, transparent samples. DIC works on the principle of interferometry to gain information about the optical path length of the sample, to see otherwise invisible features. A relatively complex optical system produces an image with the object appearing black to white on a grey background. This image is similar to that obtained by phase contrast microscopy but without the bright diffraction halo. The technique was developed by Georges Nomarski.

单词	Differential interference contrast microscopy
释义	Differential interference contrast microscopy 英语百科 Differential interference contrast microscopy Differential interference contrast (DIC) microscopy, also known as Nomarski interference contrast (NIC) or Nomarski microscopy, is an optical microscopy technique used to enhance the contrast in unstained, transparent samples. DIC works on the principle of interferometry to gain information about the optical path length of the sample, to see otherwise invisible features. A relatively complex optical system produces an image with the object appearing black to white on a grey background. This image is similar to that obtained by phase contrast microscopy but without the bright diffraction halo. The technique was developed by Georges Nomarski.
随便看	IECO iEconomy iec specifications I.E.D. I.E.D IED Ieda IEDB IEDD iedi I i.e.d.s IEE IEEE IEEE 1076 IEEE 1394 IEEE 488 ieee 696 IEEE 754 IEEE802 IEEE 802 IEEE 802.1 IEEE 802.10 IEEE 802.11 IEEE 802.2