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单词 Scanning capacitance microscopy
释义

Scanning capacitance microscopy

英语百科

Scanning capacitance microscopy

Scanning capacitance microscopy (SCM) is a variety of scanning probe microscopy in which a narrow probe electrode is held just above the surface of a sample and scanned across the sample. SCM characterizes the surface of the sample using information obtained from the change in electrostatic capacitance between the surface and the probe.

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