The magnetooptic Kerr effect ( MOKE ) of each unit was systematicly measured under 1 T magnetic field.

在1T的恒定磁场条件下,系统地测试了芯片各单元在不同退火条件下的磁光克尔谱.

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For magnetic thin films the magnetic axis in the longitudinal direction, where Kerr effect is obvious.

对于很多磁性薄膜,易磁轴方向为纵向, 通常纵向克尔效应较明显.

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