| 单词 | climatic test |
| 释义 | 例句释义: 气候试验,自然环境类试验,环境测试,环境适应性 1. Semiconductor devices - Mechanical and climatic test methods - Part 31 : flammability of plastic-encapsulated devices (internally induced). 半导体器件.机械和气候试验方法.第31部分：塑料密封器件的易燃性（内部引起的） www.mapeng.net 2. Provides the methods for analysing uncertainties of temperature and humidity in climatic test chambers. 提供了对温度和湿度气候试验箱内部环境条件进行不确定度分析的方法。 lib.cqvip.com 3. semiconductor devices - mechanical and climatic test methods - part 12 : vibration , variable frequency. 半导体装置。机械和气候试验方法。第12部分：可变频率振动。 www.ichacha.net 4. Semiconductor devices - Mechanical and climatic test methods - Part 3 : external visual examination. 半导体器件.机械和气候试验方法.第3部分：外观检验 www.mapeng.net 5. Semiconductor devices - Mechanical and climatic test methods - Part 5 : steady-state temperature humidity bias life test. 半导体器件.机械和气候试验方法.第5部分：稳态温度湿度偏差耐久性试验 www.mapeng.net 6. Semiconductor devices - Mechanical and climatic test methods - Part 18 : ionizing radiation (total dose). 半导体器件.机械和气候试验方法.第18部分：电离辐射（总剂量） www.mapeng.net 7. Semiconductor devices - Mechanical and climatic test methods - Part 17 : neutron irradiation. 半导体器件.机械和气候试验方法.第17部分：中子辐照 www.mapeng.net 8. Semiconductor devices - Mechanical and climatic test methods - Part 36 : acceleration steady state. 半导体器件.机械和气候试验方法.第36部分：稳态加速 www.mapeng.net 9. Semiconductor devices - Mechanical and climatic test methods - Part 10 : mechanical shock. 半导体器件.机械和气候试验方法.第10部分：机械振动 www.mapeng.net 10. Semiconductor devices - Mechanical and climatic test methods - Part 13 : salt atmosphere. 半导体器件.机械和气候试验方法.第13部分：盐性环境 www.mapeng.net 1. Semiconductor devices - Mechanical and climatic test methods - Part 6 : storage at high temperature. 半导体器件.机械和气候试验方法.第6部分：高温下储存 www.mapeng.net 2. Semiconductor devices - Mechanical and climatic test methods - Part 22 : bond strength. 半导体器件.机械和气候试验方法.第22部分：粘接强度 www.mapeng.net 3. Semiconductor devices - Mechanical and climatic test methods - Part 19 : die shear strength. 半导体器件.机械和气候试验方法.第19部分：模剪切强度试验 www.mapeng.net 4. Semiconductor devices - Mechanical and climatic test methods - Part 1 : general. 半导体器件.机械和气候试验方法.第1部分：总则 www.mapeng.net 5. Semiconductor devices - Mechanical and climatic test methods - Part 2 : low air pressure. 半导体器件.机械和气候试验方法.第2部分：低气压 www.mapeng.net 6. Semiconductor devices - Mechanical and climatic test methods - Flammability of plastic-encapsulated devices (externally induced) 半导体器件.机械和气候试验方法.塑料包封器件的易燃性（外部感应） www.mapeng.net 7. Sensitive switches for communication technology; climatic test categories, measuring methods and testing procedures 电信工程用速动开关.气候试验等级.测量和检验方法 www.mapeng.net 8. Semiconductor devices - Mechanical and climatic test methods - Resistance to soldering temperature for through-hole mounted devices 半导体器件.机械和气候试验方法.通孔安装设备的耐钎焊温度 www.mapeng.net 9. Semiconductor devices - Mechanical and climatic test methods - Vibration, variable frequency 半导体器件.机械和气候试验方法.变频率振动 www.mapeng.net 10. Semiconductor devices - Mechanical and climatic test methods - External visual examination 半导体器件。机械和气候试验方法。外观检验 www.std168.com 1. Semiconductor devices - Mechanical and climatic test methods - Acceleration, steady state 半导体器件.机械和气候试验方法.稳态加速 www.mapeng.net 2. Semiconductor devices - Mechanical and climatic test methods - Steady-state temperature humidity bias life test 半导体器件.机械和气候试验方法.稳态温度湿度偏差寿命试验 www.mapeng.net 3. Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced) 半导体器件.机械和气候试验方法.第32部分：塑料密封器件的易燃性（外部引起的） www.mapeng.net 4. Semiconductor devices - Mechanical and climatic test methods - Rapid change of temperature - Two-fluid-bath method 半导体器件.机械和气候试验方法.温度速变.双流体浸泡法 www.mapeng.net 5. Semiconductor devices - Mechanical and climatic test methods - Mechanical shock 半导体器件.机械和气候试验方法.机械振动 www.mapeng.net 6. Semiconductor devices - Mechanical and climatic test methods - Storage at high temperature 半导体器件.机械和气候试验方法.高温下储存 www.mapeng.net 7. Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity) 半导体器件。机械和气候试验方法。第14部分：终端装置的坚固性（引线牢固性） www.sungtek.com 8. Semiconductor devices - Mechanical and climatic test methods - Low air pressure 半导体器件.机械和气候试验方法.低气压 www.mapeng.net 9. Mechanical and climatic test methods for semiconductor devices 半导体器件机械和气候试验方法 blog.globalimporter.net 10. Mechanical and climatic test methods for microcircuit modules 微电路模块机械和气候试验方法 www.zftrans.com 1. Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking 半导体器件。机械和气候试验方法。第9部分：标记的持久性 www.sungtek.com 2. Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing 半导体器件。机械和气候试验方法。第8部分：密封 www.sungtek.com |
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