| 单词 | test probe |
| 释义 | 例句释义: 测试探针,测试探头,标准之测试探针,试验探头 1. If the thruster being tested is not fixed on the test stand and only ejects towards a test probe, then the above problem can be avoided. 如果不将推进器安装在测试台架上，而只对准探头喷射，进行间接测力，则可避免引线干扰的问题。 hkxb.buaa.edu.cn 2. The invisible short circuit fault paths could sometimes be eliminated by running a test probe between the affected fine pitch leads. 不可见的短路有时会因有测针在引脚间划过而消失 wenku.baidu.com 3. The utility model relates to a semiconductor test device, in particular to a semiconductor test probe. 本实用新型涉及一种半导体测试器件，尤其是半导体测试探针。 ip.com 4. Wafer-level IC test probe card is mainly used in the test of chips electric characters before packaging. 集成电路圆片级测试探卡主要应用于分片封装前对芯片电学性能进行初测。 dictall.com 5. Aerospace series - Elements of electrical and optical connection - Test methods - Part 6415 : optical elements - Test probe damage. 航空航天系列.电气及光学连接件.试验方法.第6415部分：光学件.检测探针损伤 www.mapeng.net 6. Aerospace series - Elements of electrical and optical connection - Test methods - Part 415 : test probe damage (female contacts). 航空航天系列.电气及光学连接件.试验方法.第415部分：检测探针损伤（塞孔接点） www.mapeng.net 7. The present invention is directed to a test probe having an indexable probe tip. 本发明涉及具有可标引的探针针尖的测试探针。 ip.com 8. turn off the MT1-01 and DUN power before removing al test probe and fixtures. 关闭MT1-01和邓白氏电源，然后删除基地测试探头及固定装置。 iask.sina.com.cn 9. Elements of electrical and optical connection - Test methods - Optical elements - Test probe damage 光电连接件.试验方法.光学件.检测探针损伤 www.mapeng.net 10. Elements of electrical and optical connection - Test methods - Test probe damage (female contacts) 光电连接件.试验方法.测试探针损伤（塞孔接点） www.mapeng.net 1. Test Probe of Development Strategy of Intellectual Economy 试论我国知识经济的发展战略 www.ilib.cn 2. Design of test probe of magnetic flux leakage for drill pipe 钻杆漏磁检测探头的设计 service.ilib.cn 3. Test Probe For Burn-In Board 崩应预烧测试板测试头 www.2ic.cn |
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