| 单词 | test generation |
| 释义 | 例句释义: 测试生成,测试产生,测试向量产生 1. Experimental results show that by using the techniques, the number of faults to be tested for test generation decreases greatly. 实验结果表明，这些精简故障的方法较大幅度的精简了需要进行测试产生的目标故障数。 www.fabiao.net 2. The test generation is one of the key problems in test. 其中，电路的测试生成是测试的核心问题之一。 www.fabiao.net 3. The main test generation who feel person-years could not understand the clothing should be avoided. 凡是主试人年辈的人觉得看不惯的服装最好不要穿。 zhidao.baidu.com 4. The capability of model checking to output counterexamples provides a basis for automated test generation. 模型检验输出的反例提供了一种自动产生测试用例的有效途径。 fcst.ceaj.org 5. In addition, its built-in data correlation filters detect variable data, as well as preparing tests for data-driven load test generation. 另外，它的嵌入式数据相关性过滤器能够检查可变数据，并根据数据驱动加载测试需求进行测试。 www.ibm.com 6. A new testability measure is presented to guide test generation such that test patterns with fewer care bits are obtained. 一个新的测度被提出以获得具有较少的确定位数量的确定性测试向量。 www.fabiao.net 7. By using backtrace and backtrack of FAN algorithm, the efficiency of test generation algorithm has be improved. 利用了FAN算法的多路回退和回溯等主要特色，提高了测试生成算法的效率。 www.ceps.com.tw 8. Then it summarized theory of test generation and test process of combined digital IC. 概述了测试的基本过程及测试生成概念和原理； www.ceps.com.tw 9. Experiments of some examples demonstrate that the test generation efficiency is enhanced 200 times, and the fault coverage has little loss. 实验结果表明，优化之后测试产生算法效率有了较大的提高，并且故障覆盖率损失较小。 www.fabiao.net 10. After the test generation process is complete, the test suite will open in the Test Editor view. 当测试生成过程完成之后，测试集将在TestEditor视图中打开。 www.ibm.com 1. A kind of model data and the preprocessing method for the logic circuit test generation system (TGS) are presented. 讨论了逻辑电路测试生成系统（简称TGS）中使用的一种模型数据及预处理方法。 www.dictall.com 2. If you use Java code generation, Rails can give you some good ideas about how to augment your code generation with test generation. 如果使用Java代码生成，Rails可以为您提供一些关于如何使用测试生成增强您的代码生成的好主意。 www.ibm.com 3. This paper explores an approach to test generation of sequential circuits based on ASM diagrams. 本文研究了基于ASM图的时序电路测试向量生成方法。 epub.cnki.net 4. Novel Circuit-parallel Test Generation Algorithm for Synchronous Sequential Circuit 面向同步时序电路的电路并行测试生成算法 ilib.cn 5. Chaos genetic algorithm and its application in test generation 一种混沌遗传算法及其在测试生成中的应用 ilib.cn 6. The Application of neural networks in the simulation-based test generation algorithm for hybrid circuits 神经网络在组合电路故障模拟测试生成算法中的应用 www.ilib.cn 7. Test Generation Algorithm Using Complete Test Vector of the Primitive Gates 采用基本门单元完全测试矢量的测试生成算法 www.ilib.cn 8. A Multiple Faults Test Generation Method for Digital Circuits with Artificial Neural Network 数字电路多故障测试生成的神经网络方法研究 www.ilib.cn 9. Test Generation of State Group Differentiating Sequence Set for Sequential Systems 时序系统的状态组区别序列测试方法 168.160.184.78 10. State Test Generation and Simplification for Synchronous Circuits 时序电路状态测试与精简方法研究 www.ilib.cn 1. The Multiple Fault Form Coexistence Test Generation Algorithm with Both W-O and W-A Diagonal Independence 同时具备W-O和W-A对角独立性的多故障测试生成算法 www.ilib.cn 2. A Dynamic Hierarchical Framework for VLSI Parallel Test Generation Systems VLSI并行测试生成系统的一种动态层次框架 service.ilib.cn 3. Distinguishable Fault Methods of Circuits Test Generation 电路测试的可区分故障算法研究 www.ilib.cn 4. An Retiming-based Indirect Test Generation for Performance-Driven Control Logic 基于重定时的高性能控制电路间接测试生成方法 www.ilib.cn 5. Study on Automatic Test Generation of Sequential Circuits Using Ant Algorithm 蚂蚁算法在时序电路测试生成中的应用研究 service.ilib.cn 6. Path Sensitizing Method for Test Generation of Multiple-valued Logic Circuits 多值逻辑电路测试的敏化路径法研究 ilib.cn 7. Test Generation Algorithm Based Three-valued Neural Networks for Combinational Circuits 基于三值神经网络的组合电路测试生成算法 ilib.cn 8. Binary decision diagram method for test generation of digital circuits 数字电路测试生成的二元判定图方法 www.ilib.cn 9. Neural networks based test generation algorithm for combinational logic circuits 基于神经网络的组合电路测试生成算法 www.ilib.cn 10. Optimization Problem of Boundary Scan Test Generation Algorithm 边界扫描测试生成算法优化问题 www.ilib.cn 1. New tendency of hierarchical test generation for digital circuit 数字电路的层次化测试生成新趋势 www.ilib.cn 2. Delay Test Generation for Processors Combining RTL and Gate Level Netlist RTL和门级结合的处理器时延测试产生方法 service.ilib.cn 3. The Optimum Test Generation Algorithm with Minimal Search Space 具有最小搜索空间的优化测试生成算法 service.ilib.cn 4. Random Test Generation with Single Weighted Set for Digital Systems 数字电路多加权集随机测试生成方法 www.ilib.cn 5. Research on test-generation technology of combined digital IC 组合数字集成电路测试生成技术研究 www.ilib.cn 6. Fault Collapsing and Test Generation for At-speed Current Testing 全速电流测试的故障精简和测试生成 service.ilib.cn 7. An Approach to Test Generation Strategy for Pairwise Testing 成对测试中的测试生成策略研究 www.ilib.cn 8. Test Generation for Crosstalk-Induced Delay Faults 针对串扰引起的时延故障的测试产生 www.ilib.cn 9. Incremental Test Generation Based on UML Specification Description 基于UML规格说明的增量式测试用例生成 service.ilib.cn 10. The research of multi-fault test generation for combinational logic circuits 组合逻辑电路多故障测试生成算法的研究 www.ilib.cn 1. Automatic test generation based on hierarchical finite state machines 基于分层有限状态自动机的一致性测试生成 www.ilib.cn 2. A multiple faults test generation algorithm based on neural networks for digital circuits 基于神经网络的数字电路多故障测试生成算法 www.ilib.cn 3. Test Generation of Sequential Circuits Based on Ant Algorithm and Genetic Algorithm 基于蚂蚁算法和遗传算法的时序电路测试生成 service.ilib.cn 4. A Kind of Anti-aliasing Test Generation Algorithm with the Minimal Compact Index 一种紧凑性指标最小的抗误判算法 www.ilib.cn 5. The Parallel Test Generation Algorithms Based on Fault Allocation 故障分解的并行测试生成算法 www.ilib.cn 6. A Optimum Test Generation Algorithm Based on Chaotic and Genetic Algorithm 基于混沌和遗传算法的优化测试生成算法 www.ilib.cn 7. A Parallel Test Generation Algorithm Based on Fault Partitioning 基于故障划分的并行测试生成算法 www.ilib.cn 8. The Study of D-Algorithm for Trouble Test Generation in Combinational Circuit 组合电路的故障测试生成D算法研究 www.ilib.cn 9. Test Generation Algorithm Based on Search State Dominance for Combinational Circuits 基于搜索状态控制的组合电路测试生成算法 www.ilib.cn 10. Study on Automatic Test Generation for Logical Circuits Based on Geneticalgorithms 基于遗传算法的逻辑电路测试生成的研究 www.ilib.cn 1. The Self- Adaptive Test Generation Based on Genetic Algorithm 基于遗传算法的自适应测试生成 www.ilib.cn 2. A Test Generation Algorithm Based on Chaotic Neural Networks 一种基于混沌神经网络的测试生成算法 ilib.cn 3. A New Method of Test Generation for Combinational Circuits 组合电路测试生成的一种新方法 www.ilib.cn 4. A Test Generation Algorithm Based on Chaotic Searching 基于混沌搜索的组合电路测试生成算法 www.ilib.cn 5. An Automatic Test Generation Based on a Kind of Extended Hierarchical Finite State Machines 基于一种扩展分层有限状态机模型的测试生成 www.ilib.cn 6. A Test Generation Algorithm for Delay Fault Based on IDDT Test 一种基于IDDT测试的时延故障测试产生算法 www.ilib.cn |
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