单词 | silicon wafers | ||||||||||||||
释义 | silicon wafers
更多释义 收起释义 例句释义: 硅晶,矽晶圆奖,矽晶圆材料奖 1. One of the biggest wild cards is the supply of silicon wafers, disks the size of dinner plates that are the foundation of chip fabrication. 现在最难预测的一个情况是硅片供应,这是一种大小如餐盘一般的磁盘,是制造芯片的基础元件。 chinese.wsj.com 2. He predicted traffic growth will continue, justifying the company's massive investments in factories that turn silicon wafers into chips. 他预测流量的增长还将继续下去,从而证明该公司大规模投资芯片生产厂的合理性。 www.bing.com 3. Bonded Wafers - Two silicon wafers that have been bonded together by silicon dioxide, which acts as an insulating layer. 绑定晶圆片-两个晶圆片通过二氧化硅层结合到一起,作为绝缘层。 wenku.baidu.com 4. The plant would be able to produce chipsets with details as fine as 90 nanometres across on 300 mm silicon wafers , the NDRC said . 国家发改委表示,大连工厂将能在300毫米晶圆片上,制造精度高达90纳米的芯片组。 www.bing.com 5. Among other things, he decided to buy cheap silicon wafers that had been cast aside by the semiconductor industry. 诸事之一就是从半导体工厂买来丢弃一边的便宜晶硅片。 www.ecocn.org 6. Normally silicon wafers are cut from a larger piece of silicon. This wastes about half of the wafer material. 硅晶片通常都是从一块较大的硅上裁剪而来,此方式浪费了大概一半的圆晶原料。 m.yeeyan.org 7. "We then deposit the pieces onto silicon wafers or other, more flexible substrates, " Yang says. 杨阳表示:「我们将薄片沉积在矽晶圆或比较容易弯曲的其他基材上。」 dictsearch.appspot.com 8. Finally we know that SIMS is one of the best ways to precisely quantify the trace amount in heavy arsenic doping silicon wafers. 从中我们发现,对重掺砷单晶硅中痕量杂质磷的测定,SIMS是目前可以精确定量的有效方法之一。 www.boshuo.net 9. and taking out the bracket and the silicon wafers from the texture etching groove after texture etching and performing cleaning treatment. 将制绒后的托架及硅片由制绒槽中取出,最后进行清洗处理。 ip.com 10. Because a front-opening unified pod full of silicon wafers can be heavy (around 20 pounds), automation is a key aspect of clean-room design. 装满硅晶圆的FOUP重量可达9公斤,因此自动化操作就成了洁净室设计的一项重要内容。 www.bing.com 1. Big chip makers like Intel, Samsung and Toshiba typically hold inventories of silicon wafers for four to six weeks of production. 像英特尔、三星和东芝这样的大芯片制造商通常都会有足够4至6周生产的硅晶片库存。 www.bing.com 2. The morphology evolution of single crystal silicon wafers in the hydrothermal process was investigated. 详细研究了铁钝化多孔硅水热制备过程中单晶硅片表面的形貌演化。 stae.com.cn 3. The stress variation with temperature and thickness in copper films deposited onto silicon wafers are studied. 采用光学方法,测量了硅基镀铜膜的应力随厚度及温度变化关系。 www.chemyq.com 4. Normally silicon wafers are cut from a larger piece of silicon. 通常硅片是由一片较大的硅切割而成的。 www.bing.com 5. The dots are synthesised in a paint-like colloidal suspension which is then coated on to silicon wafers before they are cut up into chips. 这些量子点由一种类似涂料的胶状悬浮液合成,接着将其涂在未被切割成碎片的硅晶片上。 www.ecocn.org 6. In this dissertation, we have firstly obtained 3-dimensional structures on silicon wafers by simply heating zinc powder on silicon wafers. 本论文通过加热覆盖在硅片表面的金属锌粉,首次得到凹陷和凸出的三维硅表面结构。 lunwenfudao.com 7. LDK makes silicon wafers, a key ingredient in solar cells, which in turn are used in solar panels. LDK生产晶圆,这是太阳能电池的主要材料。而太阳能电池则用于太阳能板中。 www.readfree.net 8. Silicon wafers are zapped with ions, which form tiny islands with either an excess or a dearth of electrons. 矽晶圆用离子轰击,而在其上形成微小的岛,各自具备过量或者是不足的电子。 www.soxun.me 9. China now produces one-third of the world's silicon wafers. 中国目前的硅片产量占全球总产量的三分之一。 www.voa365.com 10. We offer a large selection of silicon wafers for specialized applications that are available in sizes from 100 mm to 300 mm. 我们提供了大范围的的选择硅片为专门的应用程序中提供的尺寸从100毫米到300毫米。 tech.plantsoft.com 1. A typical plant will churn out 3, 000 silicon wafers every hour, with each wafer forming one solar cell. 一家工厂通常每小时能生产3000个硅晶片,每个晶片就构成一枚太阳能电池。 www.ftchinese.com 2. These firms also produce blank silicon wafers for other chip foundries: Shin-Etsu rolls out around 1. 2 million 12-inch wafers per month. 这些工厂还为其他芯片铸造厂生产空白硅晶:Shin-Etsu每月能生产约120万12英寸的晶圆。 www.bing.com 3. Japanese makers such as Sharp are betting on a new type of thin film technology that is cheaper to produce than silicon wafers. 竞争在趋于白热化.夏普(6753.T:行情)等日本厂商准备生产一种比硅晶圆更廉价的新型薄膜太阳能电池.[ID:nCN0819855] cn.reuters.com 4. Test method for the surface quality of polished silicon wafers and epitaxial wafers by optical-reflection 硅抛光片和外延片表面质量光反射测试方法 blog.globalimporter.net 5. Standard Test Methods for Oxygen Precipitation Characterization of Silicon Wafers by Measurement of Interstitial Oxygen Reduction 通过测量晶隙氧还原表征硅片氧沉淀的标准试验方法 www.isres.com 6. Optical Reflection "Magic-mirror" Detecting Technique for Detecting Surface Defects of Semiconductor Silicon Wafers 半导体硅片表面缺陷光反射“魔镜”检测技术 www.ilib.cn 7. Phosphorous gettering of cast multicrystalline silicon wafers from different positions of the ingot 铸造多晶硅硅片的磷吸杂研究 www.ilib.cn 8. Investigation on the Iron Contamination Sources during the Fabrication of Polished Silicon Wafers 表面光电压法研究抛光硅片制造中铁沾污的来源 service.ilib.cn 9. Determination of structural characteristics and depth profile of platelet defects in hydrogen-implanted silicon wafers by HREM 注氢硅片中片状缺陷的结构特征及其深度分布的高分辨电镜研究 www.ilib.cn 10. Standard method for measuring surface flatness of polished silicon wafers by noncontact technique 硅抛光片表面平整度测试方法 www.bz01.com 1. placing the silicon wafers in a bracket and then soaking the bracket in the texture etching groove; 将硅片摆放在托架内,然后浸泡入制绒槽内; ip.com 2. Manufacturing Technique of Monocrystal Silicon Wafers 单晶硅片的制造技术 ilib.cn 3. Effect of Substrate Orientation on Microstructure of Hydrogen-Implanted Silicon Wafers 面向对注氢硅片中微结构的影响 www.ilib.com.cn 4. Test method for measuring resistivity of silicon wafers using spreading resistance probe 硅片电阻率测定扩展电阻探针法 www.zftrans.com 5. Material Removal Mechanism and Model in Chemical Mechanical Polishing of Silicon Wafers 硅晶片化学机械抛光材料去除机制与模型 ilib.cn 6. Measurement of Minority Carrier Lifetime on Silicon Wafers with Collinear Four-Probe Array 硅片少子寿命的直排四探针测试 www.ilib.cn 7. An Improved Angle Polishing Method for Measuring Subsurface Damage in Silicon Wafers 一种改进的测量硅片亚表面损伤的角度抛光方法 168.160.184.82:8080 8. Study on quality improvement of silicon wafers annealed at high temperature in hydrogen 高温氢气退火提高硅片质量的研究 www.ilib.cn 9. Test method for detection of oxidation induced defects in polished silicon wafers 硅抛光片氧化诱生缺陷的检验方法 www.zftrans.com 10. The Measurement of Nano-flexure of Silicon Wafers by Five-frame Phase-shifting Algorithm 采用五步相移技术对硅片表面翘曲形变的检测 www.ilib.cn 1. Measurement of the cut depth of grain in nano - grinding of silicon wafers 硅片纳米磨削过程中磨粒切削深度的测量 www.ilib.cn 2. Transmission Lines Embedded in Silicon Oxide Layers on Silicon Wafers 基于硅氧化层的嵌入式传输线制造 168.160.184.82:8080 3. Research on Pneumatic Control System of Automatic Barcode Labeler for Silicon Wafers 硅晶圆条形码自动贴标机的气动控制系统研究 www.ilib.cn 4. Visual inspection for sliced and lapped silicon wafers 切制硅片及磨光硅片的目视检查 www.bzw.com.cn 5. Near Infrared Imaging Detects Cracks in Silicon Wafers 用近红外成像技术检测硅晶片中的裂纹 www.ilib.cn 6. TEM Observation of Microdefects in Hydrogen-Implanted Silicon Wafers 注氢硅中微结构缺陷的TEM观察 www.ilib.cn 7. Test Method for Shallow Etch Pit Detection on Silicon Wafers 探测硅片表面浅蚀坑的测试方法 www.mapeng.net 8. Effect of Pressure on Surface Morphology of 300 mm Silicon Wafers during Double-Side Polishing 双面抛光工艺中压力对300mm硅片表面形貌的影响 168.160.184.78 9. Internal Gettering of Silicon Wafers for VLSI 超大规模集成电路硅片的内吸杂 www.ilib.cn |
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