During the method testing inside the class, the testing points are divided into four kinds and the installation of each probe function which matches the location is discussed.
进行类内方法测试时，将测试点分为四种，并分别论述适用于每种测试点位置的探针函数的设置。
2
In this paper, a simple method to measure the specific contact resistance of metal-semiconductor ohmic contact is developed, using the probe heads of the inline four probes.
本文提出一种用直线四探针头测量金属-半导体欧姆接触接触电阻率的简捷方法。
3
As with the four-point collinear probemethod, a differential measurement may be required if the sample resistance is of the same magnitude as the isolation (meter common to ground) of the voltmeter.