Transmission electron microscope (TEM), Raman spectroscopy and X ray diffraction (XRD) were used to investigate the lattice structures, phonon properties of the samples.
通过透射电境、X光衍射和拉曼散射对纳米晶的晶格结构和声子特性进行了研究。
2
The crystalline morphology and lattice constants of silica bricks in several status were investigated by the optic microscope, scanning electron microscope and X-ray diffraction.
利用光学显微镜、扫描电镜和X射线衍射仪研究了几种不同状态硅砖的晶体形貌和晶格常数。
3
The variation of refresh rate and diffraction by opaque lattice will lead to reducing diffraction efficiency and this will increase exposure depth error.