A series stepwise calibration method for C-V resistivity measuring instrument is introduced.
本文介绍一种C - v电阻率测试仪系列分段校正方法。
2
The measurement of carrier concentration profiles over a wide range of doping le-vels and depths by using automatic electrochemical C-V profiling technique is described.
本文叙述了通过自动电化学c - V剖面图技术，在宽的掺杂和深度范围内，载流子浓度纵向分布的测量。
3
The result of experiments show that color C-V method is far better than traditional methods when it transacts halftone images within fuzzy edges and severe pollution of noise.