WAXD results indicate metal ions adsorbed onto both the amorphous and crystal regions of AECTS, and the destructive degree of the crystalregion was in direct proportion to the adsorption capacity.
WAXD分析显示，金属离子的吸附不仅发生在非晶区，也渗透到晶区，对晶区的破坏程度正比于吸附量。
2
All of the currents (in virtually all integrated circuits) are confined to a very thin region near one face of a semiconductor crystal.
所有的电流(在所有的集成电路中)实际上局限于靠近半导体晶体面非常薄的区域内。
3
The density of crystal defects in the region near the crystal surface is greater than that in the center.