The FLIR B660 infrared camera uses an advanced, highly-sensitive detector for non-contactscanning across wide areas.
B660的前视红外红外摄像机采用先进的,高度敏感探测器的非接触式扫描的广泛领域。
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Micro cantilever probe of atomic force microscope (AFM) is a typical micro mechanical component, which is under a coupling deformation during the contactscanning process.
原子力显微镜(AFM)的微探针系统是典型的微机械构件,它在接触扫描过程处于耦合变形状态。
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Glasses and contact lenses do not interfere with the scanning process, and it takes only a brief moment.