Based on progressively censoredsample, the problems of estimating the reliability performance for compound system with electronic components are studied by using Bayes and MLE approaches.
在逐次截尾样本下，研究电子元件混联系统可靠性指标的估计问题。
2
In the case of K type interval censored data, the lower confidence limit of parameter is studied based on the order relation established in the sample space.