A new method of monitoring the in-situ extremely low residual reflectivity of antireflection (AR) coating of travelling-wave semiconductor laser amplifier (TW-SLA) is presented.
介绍一种实时监控行波半导体激光放大器(TW - SLA)抗反膜(AR)超低剩余反射率的新方法。
2
In argon (ar) gas, nanocrystalline silicon films are prepared by pulsed laser ablation. The influence of ambient pressure on surface morphology of nanocrystalline silicon film is studied.
采用脉冲激光烧蚀技术在氩气环境下制备了纳米硅薄膜，研究了环境气体压强对纳米硅薄膜表面形貌的影响。
3
The micellar conformation of polymeric surfactants CMC AR 12 EO 9 in aqueous solutions was studied by dynamic laser scattering and environmental scanning electron microscopy.