The structure and chemical compositions of the surface oxide film were investigated by XRD and Augerelectron spectrometry (AES).
利用X射线衍射(XRD)和俄歇电子衍射(AES)观察了表面膜的化学成分及结构。
2
Augerelectron Spectrscopy (AES) has widespread use in determining the chemical and electronic structure of solid surface (40a).
俄歇电子谱仪广泛地利用来确定固体表面的化学和电子结构(40 A)。
3
Augerelectron spectroscopy (AES), scanning electron microscopy (SEM) and atomic force microscopy (AFM) are used to analyze component and surface morphology of the films.