Voltage characteristic curve can fully reflect performance of sensor with carrier of catalyst.
电压特性曲线能比较全面地反映载体催化型传感器的性能。
2
From the Ct transient curve obtained experimentally, the minority carrier generation lifetime in semiconductor can be determined.
根据扫描所得的电容-时间瞬态曲线，可确定样品中少于产生寿命。
3
In this paper, the noise theory of monolithic multi-quantum-well passively mode-locked laser diodes (MLLDs) is discussed, and the phase variation curve with carrier population of MLLDs is found.