Several quantitative drift measurement techniques for scanning probe microscopy (SPM) were introduced. A new method using two-dimensional zero-reference masks was proposed to measure the SPM drift.
对扫描探针显微镜(SPM)仪器漂移的定量测量的几种方法进行探讨，提出应用二维零位标记进行漂移测量。
2
Before the design of digital circuit, measurementmethod of phase difference is discussed. Two-way zero passage phase detector is chosen as solution finally.
在正式进入数字电路设计之前，先讨论了相位差测量方法，并选定双向过零鉴相作为实现方案。
3
The absolute zero angle can be defined at the biggest fringe amplitude point, so this method can also achieve absolute angle measurement.