A tungstentip received discharge treatment under a high voltage over 10? KV in a field-emission microscope (FEM).
在场发射显微镜(FEM)中使用1万伏以上的电压对钨针尖进行了放电处理。
2
The tip of specimen for FIM analysis is prepared by "thin layer" electropolishing. A Clean tungstentip about 500 A radius was prepared.
描述了场离子显微镜样品的制备,并得到曲率半径为500(?),表面光洁的钨针尖。
3
The tungstentip was treated by heating before and after single walled carbon nanotubes (SWCNTs) were assembled on it, and the mass spectra of the residual gas were recorded and analyzed.