In addition, the detailed analysis of some frequently used memory test algorithms and brief analysis of some test generation algorithms for VLSI are also included in this paper.
另外本文还比较详细的分析比较了常用的存储器测试算法，简要分析了VLSI测试生成算法。
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A 32kb Static Random Access Memory (SRAM), which is widely used at present in VLSI, is designed in this paper.