VLSI partitioning is an effective method for reducing complexity of VLSIcircuit design.
电路划分是降低超大规模集成电路设计复杂性的有效方法。
2
This paper proposes a new algorithm for computing the maximum distance sequence, which are general for VLSIcircuit test and software test technique.
本文提出了求多个测试序列极大距离的算法,该算法对数字电路的测试和软件测试技术是通用的。
3
This study offers a theoretical basis and noise detection method for VLSIcircuit components selection, faults diagnosis and localization, and reliability analysis.