A new method is applied in this article to the quantitative phase analysis for weight factors of X-raydiffractionintensity.
提出了X射线衍射强度的权重因子定量相分析的新方法。
2
XRD analysis is discussed on this system, and a method of calculation content of phase content in by Xraydiffraction peak intensity is researched.
并对系统进行了X -射线分析,探讨了用x -射线衍射峰强度计算各物相含量的方法。
3
Based on the theory of X-raydiffraction and absorption, a method for measuring the thickness of film material according to the diffraction intensity of the matrix below film was established.