The theory and method of bending test on nanobeam for the measurement of Young's modulus based on atomic force microscope (AFM) are introduced.
阐述了基于原子力显微镜(afm)的弯曲测试测量纳米梁杨氏模量的理论和方法。
2
The Young's modulus of silicon nano-beam on <100> direction was measured by bending test method using an atomic force microscope(AFM).
阐述了基于原子力显微镜（AFM）的弯曲测试测量纳米梁杨氏模量的理论和方法。
3
There was little change in the bending strength, Young's modulus and dynamic ductility of the test wood treated by microwave irradiation and steaming appropriately.