Then, the films were characterized with X ray photoelectron spectroscopy(XPS), X ray diffraction(XRD), ultraviolet visible light absorptionspectroscopy, and atomic force microscopy(AFM).
用X光电子能谱、X射线衍射、紫外可见吸收光谱、原子力显微镜等手段对制备的薄膜进行了表征。
2
A review of the application of Ultraviolet spectrophotometry and atomic absorptionspectroscopy in pharmaceutical analysis is given.