Transient response analysis is an important part of finite elements dynamic analysis. Problem scales and velocities of serial softwares are limited on serial computers.
The Optical Transient Detector (OTD) is a highly compact combination of optical and electronic elements.
光学瞬变探测器（OTD）是光学和电子元素的一个高度紧密组合。
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In this paper, a new lumped elements latchup model consisting of four bipolar transistors is used to analyze the latchup effect of CMOS inverters in transient radiation environment.