In case of deviation of the measured average thickness from the specified average value, the WaferYield adjustment has to come into force.
万一出现,测量的平均厚度与技术要求的平均厚度出现偏差,晶片的成品率必须进行调整。
2
Internal and outsource wafer sort/final test support, abnormal yield analysis.
中测、成测生产线支持,成品率异常分析。
3
Provided is a method for manufacturing a semiconductor light emitting element, by which a sapphire wafer can be divided into chips accurately at an extremely high yield.