A new method for determining directly tracecomponent in interfering base by absorbance subtraction -second derivative spectrophotometry is proposed.
对利用差谱—二阶导数分光光度法直接测定强干扰基体中微量组分的原理和实验方法进行了探讨。
2
A new method for determining directly tracecomponent in interfering base by absorbance division-multi-wavelength linear regression spectrophotometry.
提出了用除谱-多波长线性回归分光光度法测定强干扰基体中微量组分的原理和实验方法。
3
But when it comes to those samples with complicate base or contain tracecomponent, a pretreatment step will usually be imperative for purifying and enrichment.