To reduce the storage volume of the test data during the built-in self-test (BIST), a new BIST technique based on twodimensionalcompression of test data is presented.
This algorithm is based on high-order range model, which firstly corrects range walk in the process of range compression and then corrects range bending in twodimensional frequency domain.
该算法基于高阶距离模型,首先在距离压缩时校正距离走动,然后在两维频域校正距离弯曲。
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At the same time, we introduce a kind of twodimensional inverse heat conduction problems which do not convect with outer space in doing the compression, and we have got the expected result.