Totalreflectionmethod has been commonly used to detect real contact area, however the boundary of the contact spots in the contact image obtained was vague.
光全反射法是测量真实接触面积的常用手段,然而用其测得的接触图像小,接触斑点的边界模糊。
2
A new method was developed for measuring the refractive index based on totalreflection.
介绍了一种用于全反射法折射率测量的光学系统。
3
The totalreflection guided modes method which can he very sensitive to the director configuration in the liquid crystal cell was presented.