Reliability test of flexible substrate thin-filmthermistor is researched. The reasons of failure from the testing date are found and improved advices are pointed out.
对软基底薄膜热敏电阻器的可靠试验进行了研究，由试验数据找出失效原因，并提出改进措施。
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The Ni thinfilmthermistor was therefore obtained as temperature sensor with higher resistance-temperature performance by readjusting relevant technological parameters.