In this paper are described an ISS thinfilm analyzer compatible with AES technique and all the necessary measures to switch from one technique to the other.
本文介绍一种与AES技术兼容的ISS薄膜分析器，并指出两者兼容时对仪器所必须采取的各种重要措施。
2
A novel low temperature switch material VO2 thinfilm was fabricated by ion-sputtering and annealing.
采用离子束溅射和退火工艺制备了一种新的相变型薄膜vo2。
3
When these switch components are composed of a thinfilm transistor, the testing device at least includes a switch wiring coupled to the gates of the thinfilm transistor.