In this paper are described an ISS thinfilm analyzer compatible with AES technique and all the necessary measures to switch from one technique to the other.
本文介绍一种与AES技术兼容的ISS薄膜分析器，并指出两者兼容时对仪器所必须采取的各种重要措施。
2
When these switch components are composed of a thinfilm transistor, the testing device at least includes a switch wiring coupled to the gates of the thinfilm transistor.
当开关组件是由薄膜晶体管所构成时，测试装置更包括至少一开关配线，电性耦接至薄膜晶体管的闸极。
3
A novel low temperature switch material VO2 thinfilm was fabricated by ion-sputtering and annealing.