The electroluminescent characteristics are measured of the organic thin film device using TPD as the hole transporting layer and 8-hydroxyquinoline zinc as the emitting layer.

As the detecting material of uncooled infrared detectors, vanadium oxide (VOX) thin films need high temperature coefficient of resistance (TCR) and suitable film resistance for using of the device.

Pattern formation method, thin film transistor, display device and manufacturing method of these device, and television set.