As the detecting material of uncooled infrared detectors, vanadium oxide (VOX) thin films need high temperature coefficient of resistance (TCR) and suitable film resistance for using of the device.
The electroluminescent characteristics are measured of the organic thinfilmdevice using TPD as the hole transporting layer and 8-hydroxyquinoline zinc as the emitting layer.
用TPD作空穴传输层、8-羟基喹啉锌作发光层，制备了有机薄膜器件，测量了其电致发光特性。
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Pattern formation method, thinfilm transistor, display device and manufacturing method of these device, and television set.