On the basis of electromagnetic induction principles, this paper primarily discusses the design of electrocircuits and probes for coating thicknessmonitor.
该文根据电磁感应原理，主要讨论涂层厚度监测仪电路和探头的设计。
2
In this paper, a probe of vacuum microbalance to monitor and measure for high accuracy of film thickness is introduced, thermostatic probe of the semiconductor refrigeration device.
本文研制了一种用于高精度膜厚监测的真空微量天平探头：半导体致冷器件恒温探头。
3
The particular requirement on substrate materials selecting, thin film structure design and monitor and control of thin film thickness has been discussed.