Dependence of intensity on thickness of LCFF and fluorescence spectra correction are investigated.
讨论了转光膜荧光强度与膜厚度的关系及光谱校正问题。
2
The reinforcing influence and thickness effects of the photoelastic coating was revealed and correction curves were obtained.
揭示出了光弹性贴片的增强效应和厚度效应的影响，给出了修正曲线。
3
The experiment of measuring the thickness of ZAO film and SEM fracture inspection proves that the method of correction is useful to improve the measurement precision.