In most applications the pre-set thresholdtemperatureof probes with predetermined threshold levels and the temperatureof the hot surface (of the medium) are not exactly the same.
在大多数预先设定的阈值与预定的临界水平和热表面(中期)温度探测器温度应用程序不完全相同。
2
Various MOSFET tests require making low current measurements. Some of these tests include gate leakage, leakage current vs. temperature, substrate to-drain leakage, and sub-threshold current.
Then the lowest occurring temperature must still be detectable, which implies that the thresholdtemperatureof the infrared detector must be chosen to be very low.