The test vectors of some sub-scan chains generate by controllable LFSR when these chains only need to update test vector and do not need to shift out test responses.
当某个子扫描链的测试向量需要更新且又不需要移出其测试响应时，其测试向量由可控LFSR产生。
2
In treating with a chip scan picture, adopt sub-picture segmentation and separateness disposal mode.
在芯片扫描图的信息处理中采用了子图分割和单独处理方式。
3
IEEE1149 standard and its. X sub standards are based on boundary scan technique, different standards can be appropriately selected for various of applications.