An Electrostatic Force Microscope (EFM) for testingsurface charge distribution of a sample is described.
描述了一种用于检测样品表面电荷分布的静电力显微镜(EFM)。
2
The principle and method for testingsurface crack through direct current potential difference are introduced.
首先介绍了直流电位法——裂纹扩展片检测裂纹的方法和原理。
3
The mosaic approach and fixture method can be applied to fix the sample avoiding the round polished edge and make sure the smoothness of the testingsurface.