Design for test is an important process in the chip design nowadays, testabilitydesign of wireless chip needs a much higher requirement of test technology.
可测试性设计是现代芯片设计中的关键环节,针对无线接入芯片的可测试性设计对测试技术有更高的要求。
2
Besides, it is discovered that there are some merits for error signature analysis and testabilitydesign when binary counting sequences are used as the testing input.
此外,发现用二进计数序列作为测试输入对于差错特征量可测试性设计有一定优点。
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This paper presents the important action of the simulation fault injection in the testabilitydesign, and the important steps to complete the testabilitydesign using the simulation.