A partial scan algorithm for BIST, which combines the structure analysis and testabilityanalysis, is presented in this paper.
提出了一种在内建自测试(BIST)中进行部分扫描的算法，此算法综合了电路的结构分析和可测性分析。
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TMap features several techniques, including test strategy development, test point analysis, the testability review of the test basis, and many test specification techniques and checklists.
An evaluation method fur failure sample set based on fuzzy grey relation analysis is proposed in order to obtain perfect failure sample set before testability demonstration experiment.