An inductive strain digit measuring device with 8031. single chip microcomputer has been designed with high resolution.
本文设计了一种以8031单片机为核心的高分辨电感应变数字测量装置。
2
A novel method for achieving high resolution for static strain measurement is proposed and demonstrated.
文章提出了一种对静态应变进行高分辨率测量的新方法。
3
Dynamic strain caused Bragg wavelength shift demodulation device is summarized and the method to realize the very high demodulation resolution of Bragg wavelength shift is given.