A simple formula for calculating the interfacial roughness of multilayer by using the smallAngleXraydiffraction curves of the samples is given.
提出一个利用多层膜小角X射线衍射谱衍射峰积分强度计算多层膜界面粗糙度的公式。
2
The change of the crystalline structure of UHMWPE fiber was studied by smallangleX-ray scattering (SAXS) , wide angle X-ray diffraction ( WAXD) and Raman spectroscopy.